A Microwave Method for Determination of the Recombination Rate of Nonequilibrium Charge Carriers in the Bulk and at the Surface of Doped Silicon Wafers

Author： Koshelev O.G.  

Publisher： Springer Publishing Company

ISSN： 0019-8447

Source： Industrial Laboratory, Vol.66, Iss.10, 2000-10, pp. : 663-665

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