Author： Charpenel P. Davenel F. Digout R. Giraudeau M. Glade M. Guerveno J. Guillet N. Lauriac A. Male S. Manteigas D. Meister R. Moreau E. Perie D. Relmy-Madinska F. Retailleau P.
Publisher： Elsevier
ISSN： 0026-2714
Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1401-1404
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