Increased hot carrier effects in Gate-All-Around SOI nMOSFET's

Author： Tae Park J. Jong Choi N. Gun Yu C. Hee Jeon S. Colinge J.-P.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1427-1432

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