Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs

Author： Djoric-Veljkovic S.   Manic I.   Davidovic V.   Golubovic S.   Stojadinovic N.  

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1455-1460

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