Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure

Author： Pil Kim Y.   Chung U.   Tae Moon J.   Kim S.U.  

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1461-1464

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