Author: Mendizabal L. Verneuil J.L. Bechou L. Aupetit-Berthelemot C. Deshayes Y. Verdier F. Dumas J.M. Danto Y. Laffitte D. Goudard J.L. Hernandez Y.
Publisher: Elsevier
ISSN: 0026-2714
Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1743-1749
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