High reliability level demonstrated on 980nm laser diode

Author： Van de Casteele J. Laffitte D. Gelly G. Starck C. Bettiati M.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1751-1754

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