Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's

Author： Castellazzi A. Kartal V. Kraus R. Seliger N. Honsberg-Riedl M. Schmitt-Landsiedel D.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1877-1882

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