Characterization and reliability of a switch matrix based on MOEMS technology

Author: Boyer Heard I.   Coquille R.   Riviere D.   Klimonda P.-Y.  

Publisher: Elsevier

ISSN: 0026-2714

Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1935-1937

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract