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Journal of Semiconductors, Vol. 36, Iss. 4, 2015-04 ,pp. : 44004-44009

IOP Publishing

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Mechanism of photoluminescence of silicon oxide films enriched by Si or Ge

By Torchynska T.V.   Aguilar-Hernandez J.   Schacht Hernandez L.   Polupan G.   Goldstein Y.   Many A.   Jedrzejewski J.   Kolobov A.  

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Nanometer-scale investigation of metal-SiC interfaces using ballistic electron emission microscopy

By Im H.   Kaczer B.   Pelz J.   Limpijumnong S.   Lambrecht W.   Choyke W.  

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Photoluminescence Analysis of Iron Contamination Effect in Multicrystalline Silicon Wafers for Solar Cells

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Effect of Radiation-Induced Defect Clusters on Current Flow through a Quasi-ballistic GaAs MESFET

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