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Atomic Force Microscopy Examination of the Evolution of the Surface Morphology of \hbox{Bi}_{4}\hbox{Ti}_{3}\hbox{O}_{12} grown by Molecular Beam Epitaxy

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Synthesis and properties of ferroelectric Si-doped (Bi, Nd) 4 Ti 3 O 12 thin films by chemical solution deposition

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Ferroelectric Properties of (Bi, Sm) 4 Ti 3 O 12 (BST) Thin Films Fabricated by a Metalorganic Solution Deposition Method

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