Effects of Rapid Thermal Annealing on the Device Characteristics of Quantum Well Infrared Photodetectors

Author: Sengupta D.K.   Fang W   Malin J.I.   Curtis A.P.   Horton T.   Kuo H.C.   Turnbull D.   Lin C.H.   Li J.   Hsieh K.C.   Chuang S.L.   Adesida I.   Feng M.   Bishop S.G   Stillman G.E.   Gibson J.M.   Chen H.   Mazumder J.   Liu H.C.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.26, Iss.1, 1997-12, pp. : 43-51

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