Author: Chui H. Biefeld R. Hammons B. Breiland W. Brennan T. Jones E. Moffat H. Kim M. Grodzinski P. Chang K. Lee H.
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.26, Iss.1, 1997-12, pp. : 37-42
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