Role of interface chemistry and growing surface stoichiometry on the generation of stacking faults in ZnSe/GaAs

Author: Kuo L.   Kimura K.   Miwa S.   Yasuda T.   Yao T.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.26, Iss.2, 1997-02, pp. : 53-63

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