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Springer Publishing Company

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Assessment of Tight Pixel Geometry Influence on Surface Chemistry of Hg 1−X Cd X Te Focal Plane Array by Time of Flight–Secondary Ion Mass Spectroscopy: Novel Analytical Methods

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Rutherford backscattering and secondary ion mass spectrometry investigation of Mg:Ag-tris(8-hydroxy quinoline) aluminum interfaces

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Modeling of junction formation and drive-in in ion implanted HgCdTe

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