Performance assessment of scaled strained-Si channel-on-insulator (SSOI) CMOS

Author: Kim K.   Chuang C.-T.   Rim K.   Joshi R.V.  

Publisher: Elsevier

ISSN: 0038-1101

Source: Solid-State Electronics, Vol.48, Iss.2, 2004-02, pp. : 239-243

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