Period of time: 2014年3期
Publisher: MAIK Nauka/Interperiodica
Founded in: 1972
Total resources: 32
ISSN: 1063-7397
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Russian Microelectronics,volume 34,issue 3
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Residual-Photoresist Removal from Si and GaAs Surfaces by Atomic-Hydrogen Flow Treatment
By Anishchenko E.,Kagadei V.,Nefedtsev E.,Oskomov K.,Proskurovski D.,Romanenko S. in (2005)
Russian Microelectronics,volume 34,issue 3 , Vol. 34, Iss. 3, 2005-05 , pp.Electrical Behavior of
By Kovalevskii A.,Borisenko V.,Borisevich V.,Dolbik A. in (2005)
Russian Microelectronics,volume 34,issue 3 , Vol. 34, Iss. 3, 2005-05 , pp.Making Anodic Alumina Thin Films Having a Pore Array
By Vorobyova A.,Outkina E. in (2005)
Russian Microelectronics,volume 34,issue 3 , Vol. 34, Iss. 3, 2005-05 , pp.Adjusting the Spectral Response of Silicon Photodiodes by Additional Dopant Implantation
By Vanyushin I.,Gergel’ V.,Zimoglyad V.,Tishin Yu. in (2005)
Russian Microelectronics,volume 34,issue 3 , Vol. 34, Iss. 3, 2005-05 , pp.Response Mechanism of the Base-in-Well Bipolar Magnetotransistor
Russian Microelectronics,volume 34,issue 3 , Vol. 34, Iss. 3, 2005-05 , pp.Square-Membrane Deflection and Stress: Identifying the Validity Range of a Calculation Procedure
By Gridchin V.,Grichenko V.,Lubimsky V. in (2005)
Russian Microelectronics,volume 34,issue 3 , Vol. 34, Iss. 3, 2005-05 , pp.Positron-Annihilation-Spectroscopy Study of Proton-Induced Defects in Silicon
By Grafutin V.,Ilyukhina O.,Myasishcheva G.,Kalugin V.,Prokopiev E.,Timoshenkov S.,Khmelevskii N.,Funtikov Yu. in (2005)
Russian Microelectronics,volume 34,issue 3 , Vol. 34, Iss. 3, 2005-05 , pp.Transient Analysis of Subnanosecond Integrated ADCs
By Marcinkevicius A.,Poviliauskas D.,Jasonis V. in (2005)
Russian Microelectronics,volume 34,issue 3 , Vol. 34, Iss. 3, 2005-05 , pp.