Russian Microelectronics,volume 34,issue 3  (05-2014)

Period of time: 2014年3期

Publisher: MAIK Nauka/Interperiodica

Founded in: 1972

Total resources: 32

ISSN: 1063-7397

Subject: TN Radio Electronics, Telecommunications Technology

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Russian Microelectronics,volume 34,issue 3

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Positron-Annihilation-Spectroscopy Study of Proton-Induced Defects in Silicon

By Grafutin V.,Ilyukhina O.,Myasishcheva G.,Kalugin V.,Prokopiev E.,Timoshenkov S.,Khmelevskii N.,Funtikov Yu. in (2005)

Russian Microelectronics,volume 34,issue 3 , Vol. 34, Iss. 3, 2005-05 , pp. 181-186

MAIK Nauka/Interperiodica

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