Journal of Electronic Testing,volume 19,issue 2  (04-2014)

Period of time： 2014年2期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

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Journal of Electronic Testing,volume 19,issue 2

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Editorial

By Agrawal V.D. in (2003)

Journal of Electronic Testing,volume 19,issue 2 , Vol. 19, Iss. 2, 2003-04 , pp. 95-95

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New Editorial Board Members

By in (2003)

Journal of Electronic Testing,volume 19,issue 2 , Vol. 19, Iss. 2, 2003-04 , pp. 97-98

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Test Technology Technical Council Newsletter

By Ivanov A. in (2003)

Journal of Electronic Testing,volume 19,issue 2 , Vol. 19, Iss. 2, 2003-04 , pp. 99-100

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Guest Editorial

By Ivanov A. in (2003)

Journal of Electronic Testing,volume 19,issue 2 , Vol. 19, Iss. 2, 2003-04 , pp. 101-102

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Instruction-Based Self-Testing of Processor Cores

By Kranitis N. in (2003)

Journal of Electronic Testing,volume 19,issue 2 , Vol. 19, Iss. 2, 2003-04 , pp. 103-112

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LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects

By Sekar K. in (2003)

Journal of Electronic Testing,volume 19,issue 2 , Vol. 19, Iss. 2, 2003-04 , pp. 113-123

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Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits

By Volkerink E.H. in (2003)

Journal of Electronic Testing,volume 19,issue 2 , Vol. 19, Iss. 2, 2003-04 , pp. 125-135

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Performance Comparison of VLV, ULV, and ECR Tests

By Jiang W. in (2003)

Journal of Electronic Testing,volume 19,issue 2 , Vol. 19, Iss. 2, 2003-04 , pp. 137-147

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A Hierarchical Test Generation Approach Using Program Slicing Techniques on Hardware Description Languages

By Vedula V.M. in (2003)

Journal of Electronic Testing,volume 19,issue 2 , Vol. 19, Iss. 2, 2003-04 , pp. 149-160

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A Symbolic Inject-and-Evaluate Paradigm for Byzantine Fault Diagnosis

By Huang S-Y. in (2003)

Journal of Electronic Testing,volume 19,issue 2 , Vol. 19, Iss. 2, 2003-04 , pp. 161-172

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