Theoretical analysis of edge parasitic transistor effects in mesa-isolated fully-depleted SOI NMOS devices

Author: Wang Hongmei   Xi Xuemei   Zhang Xing   Wang Yangyuan  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3060

Source: International Journal of Electronics, Vol.85, Iss.1, 1998-07, pp. : 11-19

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Abstract