Deep-submicrometre fully-depleted SOI MOSFET drain current model for digital/analogue circuit simulation

Author: Hu Man-Chun   Jang Sheng-Lyang  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3060

Source: International Journal of Electronics, Vol.84, Iss.3, 1998-03, pp. : 167-185

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract