Equivalent doping profile transformation: a new analytical method to predict breakdown voltage of the composite p–n junction

Author: He Jin   Li Yingxue   Zhang Xing   Wang Yangyuan  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3060

Source: International Journal of Electronics, Vol.88, Iss.10, 2001-10, pp. : 1067-1072

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Abstract