Optimisation modelling for thermal fatigue reliability of lead-free interconnects in fine-pitch flip-chip packaging

Author: Stoyanov Stoyan   Bailey Chris   Desmulliez Marc  

Publisher: Emerald Group Publishing Ltd

ISSN: 0954-0911

Source: Soldering & Surface Mount Technology, Vol.21, Iss.1, 2009-02, pp. : 11-24

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Abstract