Effect of ENIG deposition on the failure mechanisms of thermomechanically loaded lead-free 2nd level interconnections in LTCC/PWB assemblies

Author: Nousiainen O.   Kangasvieri T.   Kautio K.   Rautioaho R.   Vähäkangas J.  

Publisher: Emerald Group Publishing Ltd

ISSN: 0954-0911

Source: Soldering & Surface Mount Technology, Vol.22, Iss.3, 2010-01, pp. : 22-35

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