Effect of annealing temperature on electrical characteristics of ruthenium-based Schottky contacts on n-type GaN

Author: Ramesh C. K.   Reddy V. Rajagopal   Rao K. S. R. Koteswara  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.17, Iss.12, 2006-12, pp. : 999-1004

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content