Investigation of interfacial reaction and joint reliability between eutectic Sn–3.5Ag solder and ENIG-plated Cu substrate during high temperature storage test

Author: Yoon Jeong-Won   Chun Hyun-Suk   Jung Seung-Boo  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.18, Iss.5, 2007-05, pp. : 559-567

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