Random Telegraph Noise in 30 nm FETs with Conventional and High-κ Dielectrics

Author: Lee Angelica   Brown Andrew   Asenov Asen   Roy Scott  

Publisher: Springer Publishing Company

ISSN: 1569-8025

Source: Journal of Computational Electronics, Vol.3, Iss.3-4, 2004-10, pp. : 247-250

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Abstract