Development of a resistivity division driving method for the vertically placed RGB pixels of the eight-domain thin-film-transistors liquid crystal display

Author： Kim Su Jeong   Shin Ki-Chul   Kim Hoon   Oh Ho Gil   Jung Jaehoon   Kim Hee-Sup  

Publisher： Taylor & Francis Ltd

ISSN： 1598-0316

Source： Journal of Information Display, Vol.14, Iss.3, 2013-09, pp. : 93-96

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Hysteresis and threshold switching characteristics in thin-film-transistors with inserted Pt-Fe2O3 core–shell nanocrystals

By Baek Yoon-Jae   Yoon Tae-Sik          

Semiconductor Science and Technology, Vol. 29, Iss. 11, 2014-11 ,pp. : 115017-115022

IOP Publishing

Access to resources Recommend Favorite

Numerical simulation of Si thin film transistors

By Mok C. H.   Tong K. Y.  

International Journal of Electronics, Vol. 80, Iss. 5, 1996-05 ,pp. : 629-635

Taylor & Francis Ltd

Access to resources Recommend Favorite

Device simulations of nanocrystalline silicon thin-film transistors

By Dosev D.   Iniguez B.   Marsal L.F.   Pallares J.   Ytterdal T.  

Solid-State Electronics, Vol. 47, Iss. 11, 2003-11 ,pp. : 1917-1920

Elsevier

Access to resources Recommend Favorite

Development of a 120 Hz 110″ ultra-high-definition a-Si liquid crystal display panel

By Liao Yanping   Shao Xibin   Du Yufan   Song Yongzhi   Hu Weihao   Zhang Zhenyu   Chen Yuqiong   Wang Ying   Ma Qing   Yoon Daekeun   Wang Dan   Yuan Jianfeng   Wu Hongjiang   Guo Zongjie   Hao Zhaohui   Zhang Ji   Lv Jing  

Journal of Information Display, Vol. 15, Iss. 2, 2014-04 ,pp. : 77-80

Taylor & Francis Ltd

Access to resources Recommend Favorite

Degradation in polysilicon thin film transistors related to the quality of the polysilicon material

By Toutah H.   Tala-Ighil B.   Llibre J.F.   Boudart B.   Mohammed-Brahim T.   Bonnaud O.  

Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. : 1531-1535

Elsevier

Access to resources Recommend Favorite