Evaluation of the drain—source voltage effect on AlGaAs/InGaAs PHEMTs thermal resistance by the structure function method

Author: Lin Ma   Shiwei Feng   Yamin Zhang   Bing Deng   Yuan Yue  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.35, Iss.9, 2014-09, pp. : 94006-94010

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