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Author: Jie Wu Junfei Shi Chengyuan Dong Zhongfei Zou Yuting Chen Daxiang Zhou Zhe Hu Runze Zhan
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.35, Iss.1, 2014-01, pp. : 14003-14008
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