Correlating sampling and intensity statistics in nanoparticle diffraction experiments

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5767|48|4|1212-1227

ISSN: 0021-8898

Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.4, 2015-08, pp. : 1212-1227

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract