Instability analysis of charges trapped in the oxide of metal-ultra thin oxide-semiconductor structures

Author： Aziz A.   Kassmi K.   Maimouni R.   Olivié F.   Sarrabayrouse G.   Martinez A.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|31|3|169-178

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.31, Iss.3, 2005-09, pp. : 169-178

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