Related content

In-situ study of stress evolution during solid state reaction of Pd with Si(001) using synchrotron radiation

By Megdiche M.   Gergaud P.   Curtil C.   Thomas O.   Chenevier B.   Mazuelas A.  

Microelectronic Engineering, Vol. 70, Iss. 2, 2003-11 ,pp. : 436-441

Elsevier

Access to resources Recommend Favorite

Radiation damage of Si photodiodes by high-temperature irradiation

By Ohyama H.   Takakura K.   Shigaki K.   Kuboyama S.   Matsuda S.   Simoen E.   Claeys C.  

Microelectronic Engineering, Vol. 66, Iss. 1, 2003-04 ,pp. : 536-541

Elsevier

Access to resources Recommend Favorite

Very low temperature (450 °C) selective epitaxial growth of heavily

By Aubin J   Hartmann J M   Veillerot M   Essa Z   Sermage B  

Semiconductor Science and Technology, Vol. 30, Iss. 11, 2015-11 ,pp. : 115006-115015

IOP Publishing

Access to resources Recommend Favorite

High Current Integrated Microinductors and Microtransformers using Low Temperature Fabrication Processes*

By Park J.Y.   Allen M.G.  

Microelectronics International, Vol. 14, Iss. 3, 1997-03 ,pp. : 8-11

Emerald Group Publishing Ltd

Access to resources Recommend Favorite

Infrared Radiometry of High-Temperature Processes During the Spot Heating of Materials

By Afanas'yev A. V.   Ya. Orlov I.   Khrulev A. E.  

Radiophysics and Quantum Electronics, Vol. 47, Iss. 8, 2004-08 ,pp. : 597-602

Springer Publishing Company

Access to resources Recommend Favorite