The Effect of nitrogen partial pressure on Zr-Si-N diffusion barrier

Author: Song Z.X.   Xu K.W.   Chen H.  

Publisher: Elsevier

ISSN: 0167-9317

Source: Microelectronic Engineering, Vol.71, Iss.1, 2004-01, pp. : 28-33

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next