Ellipsometry and transport studies of thin-film metal nitrides

By Humlcek J.   Nebojsa A.   Hora J.   Strasky M.   Spousta J.   Sikola T.  

Thin Solid Films, Vol. 332, Iss. 1, 1998-11 ,pp. : 25-29

Elsevier

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Spectroscopic ellipsometry of electrochemically prepared thin film polyaniline

By Al-Attar H.A.   Al-Alawina Q.H.   Monkman A.P.  

Thin Solid Films, Vol. 429, Iss. 1, 2003-04 ,pp. : 286-294

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In situ ellipsometry studies of temperature-dependent Au thin-film growth

By Lee S.   Hong J.   Oh S.G.  

Thin Solid Films, Vol. 341, Iss. 1, 1999-03 ,pp. : 37-41

Elsevier

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Thickness change in an annealed amorphous silicon film detected by spectroscopic ellipsometry

By Yamaguchi T.   Kaneko Y.   Jayatissa A.H.   Aoyama M.  

Thin Solid Films, Vol. 279, Iss. 1, 1996-06 ,pp. : 174-179

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Real time analysis of amorphous and microcrystalline silicon film growth by multichannel ellipsometry

By Collins R.W.   Koh J.   Ferlauto A.S.   Rovira P.I.   Lee Y.   Koval R.J.   Wronski C.R.  

Thin Solid Films, Vol. 364, Iss. 1, 2000-03 ,pp. : 129-137

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