Author: Dimova-Malinovska D.
Publisher: Elsevier
ISSN: 0042-207X
Source: Vacuum, Vol.58, Iss.2, 2000-08, pp. : 183-194
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Properties of a-Si 1-x C x :H thin films deposited from the organosilane Triethylsilane
Thin Solid Films, Vol. 352, Iss. 1, 1999-09 ,pp. :
Investigation of ion irradiation effects in a-Si X C 1-X :H thin films
By Grigonis A. Silinskas M. Kopustinskas V.
Vacuum, Vol. 68, Iss. 3, 2002-11 ,pp. :