Investigations for Minimum Invasion Digital Only Built-In “Ramp” Based Test Techniques for Charge Pump PLL's

Author: Burbidge M.J.  

Publisher: Springer Publishing Company

ISSN: 0923-8174

Source: Journal of Electronic Testing, Vol.19, Iss.4, 2003-08, pp. : 481-490

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract