A new method for the analysis of high-resolution SILC data

Author: Aresu S.   De Ceuninck W.   Knuyt G.   Mertens J.   Manca J.   De Schepper L.   Degraeve R.   Kaczer B.   D'Olieslaeger M.   D'Haen J.  

Publisher: Elsevier

ISSN: 0026-2714

Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1483-1488

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract