Author: Aresu S. De Ceuninck W. Knuyt G. Mertens J. Manca J. De Schepper L. Degraeve R. Kaczer B. D'Olieslaeger M. D'Haen J.
Publisher: Elsevier
ISSN: 0026-2714
Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1483-1488
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Abstract
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