Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study

Author: Mongellaz B.   Marc F.   Danto Y.  

Publisher: Elsevier

ISSN: 0026-2714

Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1513-1518

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Abstract