Author: Trinh S. Mergens M. Verhaege K. Russ C. Armer J. Jozwiak P. Keppens B. Mohn R. Taylor G. De Ranter F. Van Camp B.
Publisher: Elsevier
ISSN: 0026-2714
Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1537-1543
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Abstract
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