A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress

Author： Dubec V. Bychikhin S. Blaho M. Pogany D. Gornik E. Willemen J. Qu N. Wilkening W. Zullino L. Andreini A.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1557-1561

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