Backside Flip-Chip testing by means of high-bandwidth luminescence detection

Author: Tosi A.   Stellari F.   Zappa F.   Cova S.  

Publisher: Elsevier

ISSN: 0026-2714

Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1669-1674

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Abstract