Author: Meneghesso G. Levada S. Zanoni E. Scamarcio G. Mura G. Podda S. Vanzi M. Du S. Eliashevich I.
Publisher: Elsevier
ISSN: 0026-2714
Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1737-1742
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Abstract
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