Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment

Author： Velardia F.   Iannuzzo F.   Busatto G.   Wyss J.   Sanseverino A.   Candelori A.   Curro G.   Cascio A.   Frisina F.  

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1847-1851

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