![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Hornung E. Scheuermann U.
Publisher: Elsevier
ISSN: 0026-2714
Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1859-1864
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Azzopardi S. Woirgard E. Vinassa J.-M. Briat O. Zardini C.
Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Sidawi Jihad Zaraket Carine Habchi Roland Bassil Nathalie Salame Chafic Aillerie Michel Charles Jean-Pierre
Microelectronics International, Vol. 31, Iss. 2, 2014-04 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Low Power Programmable Current Mode Circuits
By Wawryn K.
Analog Integrated Circuits and Signal Processing, Vol. 36, Iss. 1-2, 2003-07 ,pp. :