IGBT Power modules thermal characterization : what is the optimum between a low current - high voltage or a high current - low voltage test condition for the same electrical power?

Author： Azzopardi S.   Woirgard E.   Vinassa J.-M.   Briat O.   Zardini C.  

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1901-1906

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