Author: Drozdov N. Fedotov A.
Publisher: Elsevier
ISSN: 0167-9317
Source: Microelectronic Engineering, Vol.66, Iss.1, 2003-04, pp. : 392-399
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
New electron and hole traps in GaAsP alloy
By Teo K. L. Li M. F. Goo C. H. Lau W. S. Lim Y. T.
International Journal of Electronics, Vol. 83, Iss. 1, 1997-07 ,pp. :