Procedure to derive analytical models for microwave noise performances of Si/SiGe:C and InP/InGaAs heterojunction bipolar transistors

Author: Ramirez-Garcia E.   Aniel F.P.   Enciso-Aguilar M.A.   Zerounian N.  

Publisher: IOP Publishing

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.28, Iss.4, 2013-04, pp. : 45003-45011

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