Effect of structural defects and chemical impurities on hall mobilities in low pressure MOCVD grown GaN

Author: Hwang C.   Schurman M.   Mayo W.   Lu Y.   Stall R.   Salagaj T.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.26, Iss.3, 1997-03, pp. : 243-251

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