

Author: Lu W. Mitchel W.C. Landis G.R. Crenshaw T.R. Collins W.E.
Publisher: Elsevier
ISSN: 0038-1101
Source: Solid-State Electronics, Vol.47, Iss.11, 2003-11, pp. : 2001-2010
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content










By Vivona M Greco G Giannazzo F Nigro R Lo Rascunà S Saggio M Roccaforte F
Semiconductor Science and Technology, Vol. 29, Iss. 7, 2014-07 ,pp. :