![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Daves Walter
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.40, Iss.9, 2011-09, pp. : 1990-1997
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Vivona M Greco G Giannazzo F Nigro R Lo Rascunà S Saggio M Roccaforte F
Semiconductor Science and Technology, Vol. 29, Iss. 7, 2014-07 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Ohmic contact properties of Ni/C film on 4H-SiC
By Lu W. Mitchel W.C. Landis G.R. Crenshaw T.R. Collins W.E.
Solid-State Electronics, Vol. 47, Iss. 11, 2003-11 ,pp. :